VOXLS 30 C 320
320 kV Microfocus Reflection Target Penta Source Functionality available Flat Panel Detector Max Scan Volume: 610mm (Ø) × 1050mm (H) Max Sample Mass: 100kg central load System Mass: 10,350kg
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X-Ray CT Scanners Available
XT V 130 and 160
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XT H 225 ST 2x
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XT H 450
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VOXLS 30 C 225
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XT H 225 and 320
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VOXLS 30 C 320
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VOXLS 30 C 450
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VOXLS 40 C 450
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XT V 130 and 160
Nikon’s XT V range comprises world-class X-ray and CT systems for non-destructive inspection of electronic components (PCBs, BGAs, chips and much more).
With sub-micron feature recognition, the XT V system range meets today’s need for high performance, non-destructive inspection of complex electronic components. Nikon’s Xi Nanotech X-ray source paired with industry leading flat panel detectors produces best-in-class image quality, with seamless transition between 2D and 3D inspection.
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XT H 225 ST 2x
Nikon’s versatile microfocus CT systems for high-resolution inspection of components, ranging from tiny plastic connectors up to aluminum castings for R&D, failure analysis and production quality control.
Versatile Solutions for the Most Demanding Inspection Applications
These systems combine the versatility needed in the lab with unique features like the high-flux Rotating.Target 2.0, Half.Turn CT acquisition mode and Auto.Filament Control to shorten cycle time and improve uptime when used for shop floor series inspection.
XT H 450
Unique 450 kV microfocus X-ray solution for high-resolution inspection of large and dense components like parts produced by metal additive manufacturing, turbine blades and large castings.
Pushing the Boundaries of High-Voltage CT Inspection
Nikon’s unique 450kV microfocus source offers the necessary power to penetrate high-density parts, while achieving micron-accuracy with a spot size many times smaller than minifocus sources. Combined with the unique CLDA linear detector, sharp and scatter-free images are produced, while high-sensitivity flat panel detectors reduce scan times.
VOXLS 30 C 225
VOXLS 30 C 225
225 kV Microfocus Rotating.Target 2.0 or 225 kV Microfocus Reflection Target Auto.Filament Control available Flat Panel Detector Max Scan Volume: 620mm (Ø) × 1025mm (H) Max Sample Mass: 50kg central load System Mass: 6,950kg
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XT H 225 and 320
Nikon’s versatile microfocus CT systems for high-resolution inspection of components, ranging from tiny plastic connectors up to aluminum castings for R&D, failure analysis and production quality control.
Versatile Solutions for the Most Demanding Inspection Applications
These systems combine the versatility needed in the lab with unique features like the high-flux Rotating.Target 2.0, Half.Turn CT acquisition mode and Auto.Filament Control to shorten cycle time and improve uptime when used for shop floor series inspection.
VOXLS 30 C 450
VOXLS 30 C 450
450 kV Microfocus Rotating Target or 450 kV Microfocus Reflection Target Flat Panel Detector and Nikon CLDA available Max Scan Volume: 610mm (Ø) × 1050mm (H) Max Sample Mass: 100kg central load System Mass: 10,350kg
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VOXLS 40 C 450
VOXLS 40 C 450
Up to Dual Sources + Dual Detectors Synchronous-Style Manipulator Standard Scan Vol: 800 mm (Ø) × 1,415 mm (H) 275 kg Max Payload.
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