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XT V 130 and 160

Nikon’s XT V range comprises world-class X-ray and CT systems for non-destructive inspection of electronic components (PCBs, BGAs, chips and much more).

With sub-micron feature recognition, the XT V system range meets today’s need for high performance, non-destructive inspection of complex electronic components. Nikon’s Xi Nanotech X-ray source paired with industry leading flat panel detectors produces best-in-class image quality, with seamless transition between 2D and 3D inspection.

updated: May 8, 2023

Superior X-Ray Source

Nikon’s market-leading Xi Nanotech X-ray microfocus source is unique due to its exclusive integral generator design and unparalleled 160kV maximum energy and 20W true-target power.

PCB Analysis Suite

PCB Analysis Suite is capable of advanced measurement and analysis of BGA, bond wires, PTH and complex packages such as PoP on multi-layered boards, with automated pass/fail inspection and reporting.

Oblique Angle Concentric Imaging

Extreme oblique angle field of view up to 90°, with 360° sample rotation, maintains the region of interest thanks to intelligent software and hardware.

SmartScope M45

SmartScope M45

Large Capacity 3D Multisensor Dimensional Measuring System.

SmartScope® M45 is the next evolution of the worldwide standard in 3D multisensor metrology.

The patented IntelliCentric™-M Optical System features fixed lens optics and Virtual Zoom technology, paired with a high-density 20 MP digital metrology camera and a built-in electronic aperture, delivering an ultra-high-resolution image with low distortion – perfect for high-speed edge detection metrology.

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NimbleTrack Wireless 3D Scanning System

The NimbleTrack wireless 3D scanning system is highly compact and agile, which is designed to redefine the precise 3D measurements of small-to-medium-sized parts. Thanks to powerful on-board chips and built-in battery power supply, its 3D scanner and optical tracker are fully wireless, enabling true freedom.

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VOXLS 30 C 320

VOXLS 30 C 320

320 kV Microfocus Reflection Target Penta Source Functionality available Flat Panel Detector Max Scan Volume: 610mm (Ø) × 1050mm (H) Max Sample Mass: 100kg central load System Mass: 10,350kg

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APDIS Laser Radar

The APDIS MV4x0 is the latest generation of Nikon’s Laser Radar, offering the smallest and most productive system ever produced.

Nikon’s APDIS is the latest generation of Laser Radar offering fast, automated, non-contact inspection in a wide range of industries with a host of benefits for users.

 

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Equator 300 EH

The Equator gauging system enables process control by delivering highly repeatable, thermally insensitive, versatile and reprogrammable gauging to the shop floor.

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Freedom Arm

Go-to Measurement Where It Benefits You Most

LK Metrology launches the FREEDOM ARM range of 6 axis and 7 axis portable measuring arms – for quality control, on-machine verification, reverse engineering or 3D modelling. Available in three models, three accuracy levels and several sizes in different portable arm configurations with touch probe and laser scanner options.

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TurnCheck Series-6

TurnCheck™ Series-6 systems are precision optical shaft measuring instruments designed for shop floor environments. Rugged and reliable, TurnCheck accommodates parts up to 300 mm in length.

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C-vision Benchtop Video Contour Projector

c-vision™ Benchtop Video Contour Projector® is an easy to use, dual-magnification benchtop video contour projector. This rugged horizontal optical comparator features a compact footprint that uses very little floor space. Its rugged design and 60 lb load capacity put advanced automatic video measurement capability to work right where it is needed. Precision optics and Measure-X™ Compare electronic overlay charts make comparative inspections easy.

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