VOXLS 30 C 320
320 kV Microfocus Reflection Target Penta Source Functionality available Flat Panel Detector Max Scan Volume: 610mm (Ø) × 1050mm (H) Max Sample Mass: 100kg central load System Mass: 10,350kg
Ultra-accurate CMM
ALTERA SL HA delivers sub-micron accuracy for quality control at the highest level for all forms of precision and complex geometry.
Every aspect of ALTERA SL HA has been optimized around the desire for ultra-accurate measurements. Metrology institutes and calibration laboratories trust the performance of the raised guideway design and flexibility of the ceramic technology moving bridge for a variety of research and industrial metrology applications, and wherever precision components demand exacting measurements.
updated: March 16, 2023
Reference for Sub-micron Accuracy
The ALTERA SL Series CMM is the most advanced high accuracy system on offer from LK Metrology today. In its High Accuracy version it is among the highest accuracy CMM available on the market today, competitively challenging the market leaders in the sector.
The advanced multi-sensor ready technology optimizes the CMM throughput and provides the opportunity to broaden the application scope to new materials and components as Customer needs change.
Among its notable features are the raised shoulder of the X-axis guideway which provides ultrafast dynamics, the S-axis 0.1 micron scale for unparalled accuracy, the increased stiffness and stability of the metrology frame and the optimized scanning performance which delivers first class high accuracy and throughput.
Available in various sizes starting at 8.7.6 up to 25.20.15 which can be configured in both the high accuracy version and the very high accuracy version, specifically dedicated for the most accurate parts to be measured by customers today.
Measuring volumes from: 800x700x600 mm to 2500x2000x1500 mm
Accuracy from: 0.7+L/600
Repeatability from: 0.5 µm
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